|
週次 |
日期 |
單元主題 |
|
第1週 |
2/23 |
Week 1 Introduction
Course Introduction
Laboratory Working Safety
Instrument Principle |
|
第2週 |
3/01 |
Week 2 SEM
Illumination of SEM
Auger Electron Spectroscopy
SEM Sample Preparation
|
|
第3週 |
3/08 |
Week 3 SEM Operation
SEM Illumination & Alignment |
|
第4週 |
3/15 |
Week 4 TEM & Operation A
TEM Illumination Alignment |
|
第5週 |
3/22 |
Week 5 TEM & Operation B
TEM Imaging Alignment |
|
第6週 |
3/29 |
Week 6 Diffraction in TEM
Electron Diffraction & Diffraction Pattern Analysis
Diffraction, Tilt
|
|
第7週 |
4/05 |
Week 7 Holiday |
|
第8週 |
4/12 |
Week 8 TEM Sample Preparation
Jet Polishing
|
|
第9週 |
4/19 |
Week 9 TEM Sample Preparation
Tripod Method
|
|
第10週 |
4/26 |
Week 10 TEM Contrast A
Phase Contrast
HRTEM Image
|
|
第11週 |
5/03 |
Week 11 TEM Sample Preparation
FIB Method Demo |
|
第12週 |
5/10 |
Week 12
Midterm –TEM Operation – 2010F (Diffraction: exact zone, HRTEM) |
|
第13週 |
5/17 |
Week 13 STEM & Z Contrast
STEM Mode & Z-Contrast
|
|
第14週 |
5/24 |
Week 14 TEM Contrast B
Diffraction Contrast
Polycrystalline contrast, Thickness, Bending
Dislocation, Stacking Fault
|
|
第15週 |
5/31 |
Week 15 X-Ray EDS
X-ray Energy Dispersive Spectrum
SEM & TEM EDS collection |
|
第16週 |
6/07 |
Week 16 EBSD
EBSD Mapping |
|
第17週 |
6/14 |
Week 17 Electron Energy Loss Spectrum
EELS collection
Log-ratio, Absorption Edges |
|
第18週 |
6/21 |
Week 18 Final –TEM Operation – 2010F (Two beam, dislocation image) |